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ENS Cachan - Institut d'Alembert

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Materials Characterization

On this technical platform, you can elaborate thin film of organic compounds and you can characterise organic materials used for photophysical, photochemical or photonic applications. The study of one compound or one sample in these different domains needs a previous work of characterisation. Indeed, it's useful to know the composition, the thermal stability, or the size of the particles that you are studying in order to understand their properties.

Microscope à force atomique (AFM)
Atomic Force Microscope (AFM)

Détecteur EDX sur MEB
EDX detector installed on the Scanning Electron Microscope


Contacts

Arnaud BROSSEAU (AFM, ATG/DSC, FT-IR, Thermal Evaporator, UBM)
Laurent GALMICHE (MEB)
Isabelle LEDOUX RAK (Molecular photonic measurements)
Keitaro NAKATANI (Molecular photonic measurements)
Chi Thanh NGUYEN (Ellipsometer)

Consult the booking calendar


Booking equipment  (RESTRICTED ACCESS)

Location

The different setups are located in the following building:
- Bâtiment d'Alembert - 3rd floor - PPSM
- Bâtiment d'Alembert - 2nd floor - LPQM (Ellipsometer)
- Bâtiment de l'Institut d'Alembert - Rdc Bas - room B31 (SEM)
- Bâtiment de l'Institut d'Alembert - Rdc Bas - room B36 (Molecular photonic measurements)

Ownership of the material

Most of the apparatus lend by PPSM and LPQM to IFR d'Alembert